Laser Trimming Systems - innovative new design provides exceptional savings and low running costs for trim of:

	LTCC component trim requirements
	hybrid component trim
	organic component trim
	LSR-3230 Laser Trim System

Bare Board Test Systems - Nidec Read test
systems provide solutions for advanced test technology
including:

	semiconductor substrate interconnect C4, BGA, MCM, PGA, LTCC. CBGA
	strip ball grid array test
	prototype test
	high volume test
	reel-to-reel test
	roll-to-roll test
	flex circuit test
	panel test
	OLED test

Technology- Nidec-Read advanced test technology includes:

	step and repeat test - for multi-image panels
	CCD camera alignment
	flying probe / pin grid combination
	TRL non-contact test
	buckling beam fixtures - for very fine pitch PCB

	TDR test
	"spark" detection - new electrical test technique
	Sister - short-in-short test
	micro-short detection test

Technical Articles

TRL non-contact test

Laser Trim System

LSR-3230

Semiconductor substrate interconnect test 
          
Flying Probe & Grid Tester                      High Volume Test

    Board Test                         HDI Panel Test
    
       Board test System                  HDI Panel Test Systems

Low cost electrical test                         TDR Test Systems

R580 Test System                                 TDR Test

 Contact us?   sales@wmhague.com

Mupitron Co. DBA Hague   
 
 USA

copyright © 2004 W. M. Hague Company All rights reserved